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Magazine Name : Ieee Design And Test Of Computers

Year : 1999 Volume number : 16 Issue: 03

Testing Methodology For Firewire. (Article)
Subject: Design & Test Of Computers , To Achive Cost-Effective
Author: Lee Melatti      Barry Blancha     
page:      102 - 111
System-On-Chip Design:Impact On Education And Research. (Article)
Subject: Design & Test Of Computers , System On Chip
Author: Hugo De Man     
page:      11 - 19
Deep Submicron Cmos Current Ic Testing: Is There A Future? (Article)
Subject: Design & Test Of Computers , Deep Submicron Cmos
Author: Charls F.Hawkins      Jerry M.Soden     
page:      14 - 15
Guest Editors' Introduction:Test And The Product Life Cycle. (Article)
Subject: Design & Test Of Computers , Guest Editors' Introduction
Author: Tony Ambler      Ben Bennetts     
page:      20 - 22
Design For Test And Time To Market: A Personal Perspective. (Article)
Subject: Design & Test Of Computers , Design For Test
Author: Jon Turino     
page:      23 - 27
Board Test And The Product Life Cycle: Get Wise To Board Test Strategies. (Article)
Subject: Design & Test Of Computers , To Understand The Challenges
Author: Bernard Sutton     
page:      28 - 33
Boundary Scan: The Internet Of Test. (Article)
Subject: Design & Test Of Computers , Once We Incorporate
Author: Mike Wondolowski      Ben Bennetts     
page:      34 - 43
Automating Pbx System Testing. (Article)
Subject: Design & Test Of Computers , Automating Pbx
Author: Bertram Weber     
page:      44 - 52
Generating Functional Design Verification Tests. (Article)
Subject: Design & Test Of Computers , Ford Engineers Successfully
Author: Susana Stoica     
page:      53 - 63
Test And Reliability: Partners In Ic Manufacturing, Part 1. (Article)
Subject: Design & Test Of Computers , Discusses The Dominant Metal-
Author: Charls F.Hawkins      Jaume Segura     
page:      64 - 71
Unveiling The Iscas-85 Benchmarks: A Case Study In Reverse Engineering. (Article)
Subject: Design & Test Of Computers , The Lack Of Usable High-Level
Author: Mark C.Hancen      Hakan Yalcin      John P.Hayes     
page:      72 - 80
Economic Online Self-Test In The Time-Triggered Architecture. (Article)
Subject: Design & Test Of Computers , The Properties Of This Time-Driven
Author: Andreas Steininger      Christopher Temple     
page:      81 - 89
Fault-Secure Parity Prediction Booth Multipliers. (Article)
Subject: Design & Test Of Computers , Hardware Efficiency
Author: Michael Nicolaidis      Ricardo O.Duarte     
page:      90 - 101